Appendix E: References

1)	Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957. 2)	Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946. 3)	Davis, D.J., An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952. 4)	Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona. 5)	Dudewicz, E.J., An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952. 6)	Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988. 7)	Evans, Ralph A., The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47   St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970. 8)	Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47    St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970. 9)	Glasstone, S., Laidler, K. J., and Eyring, H. E., The Theory of Rate Processes, McGraw Hill, NY, 1941. 10)	Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967. 11)	Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952. 12)	Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952. 13)	Hirose, Hideo, Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution   IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996. 14)	Johnson, Leonard G., The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies, Industrial Mathematics, Vol. 2, 1951. 15)	Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964. 16)	Kao, J.H.K., A New Life Quality Measure for Electron Tubes, IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958. 17)	Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977. 18)	Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., New Jersey, Vol. 1, 1991. 19)	Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., New Jersey, Vol. 1 and 2, 1993 and 1994. 20)	Kececioglu, Dimitri, and Sun, Feng-Bin, Environmental Stress Screening - Its Quantification, Optimization and Management, Prentice Hall PTR, New Jersey, 1995. 21)	Kececioglu, Dimitri, and Sun, Feng-Bin, Burn-In Testing - Its Quantification and Optimization, Prentice Hall PTR, New Jersey, 1997. 22)	Leemis Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995. 23)	Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bereau of Standards, Vol. 57, p. 273, 1956. 24)	Lloyd, David K., and Lipow Myron, Reliability: Management   Methods    and Mathematics, 1962, Prentice Hall, Englewood Cliffs, New Jersey. 25)	Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974. 26)	Meeker, William Q., and Escobar, Luis A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998. 27)	Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982. 28)	Nelson, Wayne, Accelerated Testing: Statistical Models   Test Plans    and Data Analyses    John Wiley & Sons, Inc., New York, 1990. 29)	Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962. 30)	Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961. 31)	ReliaSoft Corporation, Life Data Analysis Reference, ReliaSoft Publishing, Tucson, AZ, 2000. 32)	Striny, Kurt M., and Schelling, Arthur W., Reliability Evaluation of Aluminum-Metalized MOS Dynamic RAMS in Plastic Packages in High Humidity and Temperature Environments, IEEE 31   Electronic Components Conference, pp. 238-244, 1981. 33)	Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949. 34)	Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951. 35)	Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization   Progressively Censored Samples  , IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973. 36)	Meeker, William Q., and Hahn, Gerlad J., Volume 1: How To Plan An Accelerated Life Test - Some Practical Guidelines, American Society For Quality Control, Milwaukee, 1985. 37)	Escobar, Luis A. and Meeker, William Q., Planning Accelerated Life Tests with Two or More Experimental Factors, Technometrics, Vol. 37, No. 4, pp. 411-427, 1995. 38)	Meeker, William Q., A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring, Technometrics, Vol. 26, No. 2, pp. 157-171, 1984.