Appendix E: References


 * 1) Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.
 * 2) Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.
 * 3) Davis, D.J., An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
 * 4) Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.
 * 5) Dudewicz, E.J., An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
 * 6) Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.
 * 7) Evans, Ralph A., The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47   St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
 * 8) Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47   St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
 * 9) Glasstone, S., Laidler, K. J., and Eyring, H. E., The Theory of Rate Processes, McGraw Hill, NY, 1941.
 * 10) Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.
 * 11) Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.
 * 12) Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.
 * 13) Hirose, Hideo, Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution   IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
 * 14) Johnson, Leonard G., The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies, Industrial Mathematics, Vol. 2, 1951.
 * 15) Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.
 * Kao, J.H.K., A New Life Quality Measure for Electron Tubes, IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
 * 1) Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.
 * 2) Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., New Jersey, Vol. 1, 1991.
 * 3) Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., New Jersey, Vol. 1 and 2, 1993 and 1994.
 * 4) Kececioglu, Dimitri, and Sun, Feng-Bin, Environmental Stress Screening - Its Quantification, Optimization and Management, Prentice Hall PTR, New Jersey, 1995.
 * 5) Kececioglu, Dimitri, and Sun, Feng-Bin, Burn-In Testing - Its Quantification and Optimization, Prentice Hall PTR, New Jersey, 1997.
 * 6) Leemis Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
 * 7) Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bereau of Standards, Vol. 57, p. 273, 1956.
 * 8) Lloyd, David K., and Lipow Myron, Reliability: Management   Methods    and Mathematics, 1962, Prentice Hall, Englewood Cliffs, New Jersey.
 * 9) Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.
 * 10) Meeker, William Q., and Escobar, Luis A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
 * 11) Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.
 * 12) Nelson, Wayne, Accelerated Testing: Statistical Models   Test Plans    and Data Analyses    John Wiley & Sons, Inc., New York, 1990.
 * 13) Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
 * 14) Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
 * 15) ReliaSoft Corporation, Life Data Analysis Reference, ReliaSoft Publishing, Tucson, AZ, 2000.
 * 16) Striny, Kurt M., and Schelling, Arthur W., Reliability Evaluation of Aluminum-Metalized MOS Dynamic RAMS in Plastic Packages in High Humidity and Temperature Environments, IEEE 31   Electronic Components Conference, pp. 238-244, 1981.
 * 17) Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
 * 18) Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
 * 19) Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization   Progressively Censored Samples  , IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
 * 20) Meeker, William Q., and Hahn, Gerlad J., Volume 1: How To Plan An Accelerated Life Test - Some Practical Guidelines, American Society For Quality Control, Milwaukee, 1985.
 * 21) Escobar, Luis A. and Meeker, William Q., Planning Accelerated Life Tests with Two or More Experimental Factors, Technometrics, Vol. 37, No. 4, pp. 411-427, 1995.
 * 22) Meeker, William Q., A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring, Technometrics, Vol. 26, No. 2, pp. 157-171, 1984.