Appendix: Life Data Analysis References


 * 1) Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.
 * 2) Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.
 * Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
 * 1) Davis, D.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
 * 2) Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.
 * 3) Dudewicz, E.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
 * 4) Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.
 * 5) Evans, Ralph A., "The Lognormal Distribution is Not a Wearout Distribution," Reliability Group Newsletter,  IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
 * 6) Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004.
 * 7) Gottfried, Paul, "Wear-out," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
 * 8) Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.
 * 9) Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.
 * 10) Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.
 * 11) Hirose, Hideo, "Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
 * 12) Johnson, Leonard G., "The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies," Industrial Mathematics, Vol. 2, 1951.
 * 13) Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.
 * Kao, J.H.K., "A New Life Quality Measure for Electron Tubes," IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
 * 1) Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.
 * 2) Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
 * 3) Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
 * 4) Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
 * 5) Leemis, Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
 * 6) Lieblein, J., and Zelen, M., "Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings," Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
 * 7) Lloyd, David K., and Lipow Myron, Reliability: Management, Methods, and Mathematics, Prentice Hall, Englewood Cliffs, New Jersey, 1962.
 * 8) Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.
 * 9) Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
 * 10) Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
 * 11) Mettas, A, and Zhao, Wenbiao, "Modeling and Analysis of Repairable Systems with General Repair," 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
 * 12) Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
 * 13) Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.
 * 14) Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
 * 15) NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.
 * 16) Perry, J. N., "Semiconductor Burn-in and Weibull Statistics," Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
 * 17) Procassini, A. A., and Romano, A., "Transistor Reliability Estimates Improve with Weibull Distribution Function," Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
 * 18) Weibull, Wallodi, "A Statistical Representation of Fatigue Failure in Solids," Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
 * 19) Weibull, Wallodi, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
 * 20) Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
 * Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.