Appendix D: References


 * 1) Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.
 * 2) Cramer, H.,  Mathematical Methods     of     Statistics , Princeton University Press, Princeton, NJ, 1946.
 * Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
 * 1) Davis, D.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
 * 2) Dietrich, D.,  SIE     530     Engineering     Statistics     Lecture     Notes , The University of Arizona, Tucson, Arizona.
 * 3) Dudewicz, E.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
 * 4) Dudewicz, E.J., and Mishra, Satya N., Modern     Mathematical     Statistics , John Wiley & Sons, Inc., New York, 1988.
 * 5) Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47th  St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
 * 6) Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
 * 7) Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47th  St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
 * 8) Hahn, Gerald J., and Shapiro, Samuel S.,  Statistical Models     in     Engineering , John Wiley & Sons, Inc., New York, 355 pp., 1967.
 * 9) Hald, A.,  Statistical     Theory     with     Engineering     Applications , John Wiley & Sons, Inc., New York, 783 pp., 1952.
 * 10) Hald, A.,  Statistical     Tables     and     Formulas , John Wiley & Sons, Inc., New York, 97 pp., 1952.
 * 11) Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution, IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
 * 12) Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies, Industrial Mathematics, Vol. 2, 1951.
 * 13) Johnson, Leonard G.,  The     Statistical     Treatment     of     Fatigue     Experi  -  ment , Elsevier Publishing Company, New York, 144 pp., 1964.
 * Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes, IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
 * 1) Kapur, K.C., and Lamberson, L.R.,  Reliability     in     Engineering     Design , John Wiley & Sons, Inc., New York, 586 pp., 1977.
 * 2) Kececioglu, Dimitri,  Reliability     Engineering     Handbook , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
 * 3) Kececioglu, Dimitri,  Reliability    and      Life     Testing     Handbook , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
 * 4) Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
 * 5) Leemis, Lawrence M.,   Reliability-Probabilistic     Models     and     Statistical     Methods , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
 * 6) Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
 * 7) Lloyd, David K., and Lipow Myron,  Reliability  :   Management,     Methods,     and     Mathematics , Prentice Hall, Englewood Cliffs, New Jersey, 1962.
 * 8) Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D.,  Methods     for     Statistical     Analysis     of     Reliability     and     Life     Data , John Wiley & Sons, Inc., New York, 1974.
 * 9) Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
 * 10) Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
 * 11) Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
 * 12) Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
 * 13) Nelson, Wayne,   Applied     Life     Data     Analysis , John Wiley & Sons, Inc., New York, 1982.
 * 14) Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
 * 15) NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.
 * 16) Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
 * 17) Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
 * 18) Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
 * 19) Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
 * 20) Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.