Appendix D: References

References •	Aitchison, J., Jr. and Brown, J.A.C., $$The$$   $$Lognormal$$   $$Distribution$$, Cambridge University Press, New York, 176 pp., 1957. •	Cramer, H., $$Mathematical$$   $$Methods$$   $$of$$   $$Statistics$$, Princeton University Press, Princeton, NJ, 1946. •	Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen. •	Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952. •	Dietrich, D., $$SIE$$   $$530$$   $$Engineering$$   $$Statistics$$   $$Lecture$$   $$Notes$$, The University of Arizona, Tucson, Arizona. •	Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952. •	Dudewicz, E.J., and Mishra, Satya N., $$Modern$$   $$Mathematical$$   $$Statistics$$, John Wiley & Sons, Inc., New York, 1988. •	Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 $$^{th}$$ St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970. •	Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004 •	Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 $$^{th}$$ St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970. •	Hahn, Gerald J., and Shapiro, Samuel S., $$Statistical$$   $$Models$$   $$in$$   $$Engineer$$ - $$ing$$, John Wiley & Sons, Inc., New York, 355 pp., 1967. •	Hald, A., $$Statistical$$   $$Theory$$   $$with$$   $$Engineering$$   $$Applications$$, John Wiley & Sons, Inc., New York, 783 pp., 1952. •	Hald, A., $$Statistical$$   $$Tables$$   $$and$$   $$Formulas$$, John Wiley & Sons, Inc., New York, 97 pp., 1952. •	Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996. •	Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951. •	Johnson, Leonard G., $$The$$   $$Statistical$$   $$Treatment$$   $$of$$   $$Fatigue$$   $$Experi$$ - $$ment$$, Elsevier Publishing Company, New York, 144 pp., 1964. •	Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958. •	Kapur, K.C., and Lamberson, L.R., $$Reliability$$   $$in$$   $$Engineering$$   $$Design$$, John Wiley & Sons, Inc., New York, 586 pp., 1977. •	Kececioglu, Dimitri, $$Reliability$$   $$Engineering$$   $$Handbook$$, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991. •	Kececioglu, Dimitri, $$Reliability$$   $$\And $$   $$Life$$   $$Testing$$   $$Handbook$$, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994. •	Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982. •	Leemis, Lawrence M., $$Reliability-Probabilistic$$   $$Models$$   $$and$$   $$Statistical$$   $$Methods$$, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995. •	Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956. •	Lloyd, David K., and Lipow Myron, $$Reliability$$ :  $$Management,$$   $$Methods,$$   $$and$$   $$Mathematics$$, Prentice Hall, Englewood Cliffs, New Jersey, 1962. •	Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., $$Methods$$   $$for$$   $$Statistical$$   $$Analysis$$   $$of$$   $$Reliability$$   $$and$$   $$Life$$   $$Data$$, John Wiley & Sons, Inc., New York, 1974. •	Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982. •	Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998. •	Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005. •	Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991. •	Nelson, Wayne, $$Applied$$   $$Life$$   $$Data$$   $$Analysis$$, John Wiley & Sons, Inc., New York, 1982. •	Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003. •	NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005. •	Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962. •	Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961. •	Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949. •	Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951. •	Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.