Appendix: Life Data Analysis References

1.Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.

2.Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.

3.Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.

4.Davis, D.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

5.Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.

6.Dudewicz, E.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

7.Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.

8.Evans, Ralph A., "The Lognormal Distribution is Not a Wearout Distribution," Reliability Group Newsletter,  IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

9.Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004.

10.Gottfried, Paul, "Wear-out," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.

11.Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.

12.Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.

13.Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.

14.Hirose, Hideo, "Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.

15.Johnson, Leonard G., "The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies," Industrial Mathematics, Vol. 2, 1951.

16.Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.

17.Kao, J.H.K., "A New Life Quality Measure for Electron Tubes," IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.

18.Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.

19.Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.

20.Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.

21.Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.

22.Leemis, Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.

23.Lieblein, J., and Zelen, M., "Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings," Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.

24.Lloyd, David K., and Lipow Myron, Reliability: Management, Methods, and Mathematics, Prentice Hall, Englewood Cliffs, New Jersey, 1962.

25.Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.

26.Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.

27.Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.

28.Mettas, A, and Zhao, Wenbiao, "Modeling and Analysis of Repairable Systems with General Repair," 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.

29.Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.

30.Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.

31.Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.

32.NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.

33.Perry, J. N., "Semiconductor Burn-in and Weibull Statistics," Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.

34.Procassini, A. A., and Romano, A., "Transistor Reliability Estimates Improve with Weibull Distribution Function," Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.

35.Weibull, Wallodi, "A Statistical Representation of Fatigue Failure in Solids," Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.

36.Weibull, Wallodi, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.

37.Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

38. Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.