Template:Example:CD-GLL Weibull

CD GLL-Weibull Example
A sample of 18 units of an electronic component was subjected to temperature and voltage stresses. The temperature was initially set 100K and was then continuously increased to 200K over a period of 20 hours. The temperature was again increased at 120 hours to 300K over a 20 hours period as shown in the next figure.



The voltage was initially set 4V and was then increased continuously to 8V over a period of 10 hours. The voltage was again increased at 110 hours to 12V over a 10 hours period as shown in the next figure.



The failure times, as entered in ALTA, are shown in the next figure.

The stresses are transformed using an Arrhenius life-stress relationship for temperature, a Power Law life-stress relationship for voltage and the Weibull distribution as the underlying distribution.

The estimated model parameters are shown next.


 * $$\begin{align}

\widehat{\beta }=\ & 3.507277 \\ \widehat=\ & -1.377671 \\ \widehat=\ & 450.488282 \\ \widehat=\ & 1.981082 \end{align}$$

The use level (temperature = 100K, voltage = 4V) reliability plot is shown in the next figure.