Appendix D: References - Revision history

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Redirected page to Appendix: Life Data Analysis References

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	#~~Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution , Cambridge University Press, New York, 176 pp., 1957.~~		#REDIRECT [[Appendix:_Life_Data_Analysis_References]]
	~~#Cramer, H., Mathematical Methods of Statistics , Princeton University Press, Princeton, NJ, 1946.~~
	~~#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London~~: ~~Methuen.~~
	~~#Davis, D.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.~~
	~~#Dietrich, D., SIE 530 Engineering Statistics Lecture Notes , The University of Arizona, Tucson, Arizona.~~
	~~#Dudewicz, E.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.~~
	~~#Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics , John Wiley & Sons, Inc., New York, 1988.~~
	#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
	~~#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004~~
	~~#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.~~
	~~#Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering , John Wiley & Sons, Inc., New York, 355 pp., 1967.~~
	~~#Hald, A., Statistical Theory with Engineering Applications , John Wiley & Sons, Inc., New York, 783 pp., 1952.~~
	~~#Hald, A., Statistical Tables and Formulas , John Wiley & Sons, Inc., New York, 97 pp., 1952.~~
	#Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution, IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
	~~#Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies, Industrial Mathematics, Vol. 2, 1951.~~
	~~#Johnson, Leonard G., The Statistical Treatment of Fatigue Experi - ment , Elsevier Publishing Company, New York, 144 pp., 1964.~~
	~~#Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes, IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.~~
	~~#Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design , John Wiley & Sons, Inc., New York, 586 pp., 1977.~~
	~~#Kececioglu, Dimitri, Reliability Engineering Handbook , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.~~
	~~#Kececioglu, Dimitri, Reliability and Life Testing Handbook , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.~~
	~~# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.~~
	~~# Leemis, Lawrence M., Reliability-Probabilistic Models and Statistical Methods , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.~~
	~~#Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.~~
	~~#Lloyd, David K., and Lipow Myron, Reliability : Management, Methods, and Mathematics , Prentice Hall, Englewood Cliffs, New Jersey, 1962.~~
	#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data , John Wiley & Sons, Inc., New York, 1974.
	~~#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.~~
	~~# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.~~
	~~# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.~~
	~~# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.~~
	~~# Nelson, Wayne, Applied Life Data Analysis , John Wiley & Sons, Inc., New York, 1982.~~
	~~# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.~~
	~~# NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.~~
	~~#Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.~~
	# Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
	~~# Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.~~
	~~# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.~~
	#Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

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	#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
	#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004		#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
	#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East ~~47 ^{th}~~ St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
	#Hahn, Gerald J., and Shapiro, Samuel S., Statistical		#Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering , John Wiley & Sons, Inc., New York, 355 pp., 1967.
	Models in ~~Engineer - ing~~ , John Wiley & Sons, Inc., New York, 355 pp., 1967.
	#Hald, A., Statistical Theory with Engineering Applications , John Wiley & Sons, Inc., New York, 783 pp., 1952.		#Hald, A., Statistical Theory with Engineering Applications , John Wiley & Sons, Inc., New York, 783 pp., 1952.
	#Hald, A., Statistical Tables and Formulas , John Wiley & Sons, Inc., New York, 97 pp., 1952.		#Hald, A., Statistical Tables and Formulas , John Wiley & Sons, Inc., New York, 97 pp., 1952.

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	{{InProgress}} {{LDAChapters}}		{{InProgress}} {{LDAChapters}}



	~~===References===~~

	# Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.		# Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.

	# Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.		# Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.

	# Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.		# Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.

	# Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		# Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	# Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.		# Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.

	# Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		# Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	# Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.		# Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.

	# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

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Pengying niu at 20:58, 9 May 2011

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	References		===References===

	• Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.		• Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.

Pengying niu at 20:57, 9 May 2011

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	~~{{InProgress}} {{LDAChapters}}~~		#Aitchison, J., Jr. and Brown, J.A.C., ‘The Lognormal Distribution’ , Cambridge University Press, New York, 176 pp., 1957.
			#Cramer, H., ‘Mathematical Methods’ ‘of’ ‘Statistics’ , Princeton University Press, Princeton, NJ, 1946.

	#Aitchison, J., Jr. and Brown, J.A.C., ~~<math>The</math> <math>~~Lognormal~~</math> <math>Distribution</math>~~ , Cambridge University Press, New York, 176 pp., 1957.
	#Cramer, H., ~~<math>Mathematical</math> <math>Methods</math>~~ ~~<math>of</math>~~ ~~<math>Statistics</math>~~ , Princeton University Press, Princeton, NJ, 1946.
	#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.		#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
	#Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Davis, D.J., ``An Analysis of Some Failure Data,’ J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
	#Dietrich, D., ~~<math>SIE</math>~~ ~~<math>530</math>~~ ~~<math>Engineering</math>~~ ~~<math>Statistics</math>~~ ~~<math>Lecture</math>~~ ~~<math>Notes</math>~~ , The University of Arizona, Tucson, Arizona.		#Dietrich, D., ‘SIE’ ‘530’ ‘Engineering’ ‘Statistics’ ‘Lecture’ ‘Notes’ , The University of Arizona, Tucson, Arizona.
	#Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Dudewicz, E.J., ``An Analysis of Some Failure Data,’ J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
	#Dudewicz, E.J., and Mishra, Satya N., ~~<math>Modern</math>~~ ~~<math>Mathematical</math>~~ ~~<math>Statistics</math>~~ , John Wiley & Sons, Inc., New York, 1988.		#Dudewicz, E.J., and Mishra, Satya N., ‘Modern’ ‘Mathematical’ ‘Statistics’ , John Wiley & Sons, Inc., New York, 1988.
	#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 ~~<math>~~^{th}~~</math>~~ St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,’ Reliability Group Newsletter, IEEE, Inc., 345 East 47 ‘^{th}’ St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
	#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004		#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
	#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 ~~<math>~~^{th}~~</math>~~ St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 ‘^{th}’ St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
	#Hahn, Gerald J., and Shapiro, Samuel S., ~~<math>Statistical</math>~~		#Hahn, Gerald J., and Shapiro, Samuel S., ‘Statistical’
	~~<math>Models</math>~~ ~~<math>in</math>~~ ~~<math>Engineer</math>~~ - ~~<math>ing</math>~~ , John Wiley & Sons, Inc., New York, 355 pp., 1967.		‘Models’ ‘in’ ‘Engineer’ - ‘ing’ , John Wiley & Sons, Inc., New York, 355 pp., 1967.
	#Hald, A., ~~<math>Statistical</math>~~ ~~<math>Theory</math>~~ ~~<math>with</math>~~ ~~<math>Engineering</math>~~ ~~<math>Applications</math>~~ , John Wiley & Sons, Inc., New York, 783 pp., 1952.		#Hald, A., ‘Statistical’ ‘Theory’ ‘with’ ‘Engineering’ ‘Applications’ , John Wiley & Sons, Inc., New York, 783 pp., 1952.
	#Hald, A., ~~<math>Statistical</math>~~ ~~<math>Tables</math>~~ ~~<math>and</math>~~ ~~<math>Formulas</math>~~ , John Wiley & Sons, Inc., New York, 97 pp., 1952.		#Hald, A., ‘Statistical’ ‘Tables’ ‘and’ ‘Formulas’ , John Wiley & Sons, Inc., New York, 97 pp., 1952.
	#Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.		#Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,’ IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
	#Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.		#Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,’ Industrial Mathematics, Vol. 2, 1951.
	#Johnson, Leonard G., ~~<math>The</math>~~ ~~<math>Statistical</math>~~ ~~<math>Treatment</math>~~ ~~<math>of</math>~~ ~~<math>Fatigue</math>~~ ~~<math>Experi</math>~~ - ~~<math>ment</math>~~ , Elsevier Publishing Company, New York, 144 pp., 1964.		#Johnson, Leonard G., ‘The’ ‘Statistical’ ‘Treatment’ ‘of’ ‘Fatigue’ ‘Experi’ - ‘ment’ , Elsevier Publishing Company, New York, 144 pp., 1964.
	#Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.		#Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,’ IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
	#Kapur, K.C., and Lamberson, L.R., ~~<math>Reliability</math>~~ ~~<math>in</math>~~ ~~<math>Engineering</math>~~ ~~<math>Design</math>~~ , John Wiley & Sons, Inc., New York, 586 pp., 1977.		#Kapur, K.C., and Lamberson, L.R., ‘Reliability’ ‘in’ ‘Engineering’ ‘Design’ , John Wiley & Sons, Inc., New York, 586 pp., 1977.
	#Kececioglu, Dimitri, ~~<math>Reliability</math>~~ ~~<math>Engineering</math>~~ ~~<math>Handbook</math>~~ , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.		#Kececioglu, Dimitri, ‘Reliability’ ‘Engineering’ ‘Handbook’ , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
	#Kececioglu, Dimitri, ~~<math>Reliability</math>~~ ~~<math>~~\And ~~</math>~~ ~~<math>Life</math>~~ ~~<math>Testing</math>~~ ~~<math>Handbook</math>~~ , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.		#Kececioglu, Dimitri, ‘Reliability’ ‘\And ‘ ‘Life’ ‘Testing’ ‘Handbook’ , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
	# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.		# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
	# Leemis, Lawrence M., ~~<math>Reliability~~-~~Probabilistic</math>~~ ~~<math>Models</math>~~ ~~<math>and</math>~~ ~~<math>Statistical</math>~~ ~~<math>Methods</math>~~ , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.		# Leemis, Lawrence M., ‘Reliability-Probabilistic’ ‘Models’ ‘and’ ‘Statistical’ ‘Methods’ , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
	#Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.		#Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
	#Lloyd, David K., and Lipow Myron, ~~<math>Reliability</math>~~ : ~~<math>Management~~,~~</math>~~ ~~<math>Methods~~,~~</math>~~ ~~<math>and</math>~~ ~~<math>Mathematics</math>~~ , Prentice Hall, Englewood Cliffs, New Jersey, 1962.		#Lloyd, David K., and Lipow Myron, ‘Reliability’ : ‘Management,’ ‘Methods,’ ‘and’ ‘Mathematics’ , Prentice Hall, Englewood Cliffs, New Jersey, 1962.
	#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., ~~<math>Methods</math>~~ ~~<math>for</math>~~ ~~<math>Statistical</math>~~ ~~<math>Analysis</math>~~ ~~<math>of</math>~~ ~~<math>Reliability</math>~~ ~~<math>and</math>~~ ~~<math>Life</math>~~ ~~<math>Data</math>~~ , John Wiley & Sons, Inc., New York, 1974.		#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., ‘Methods’ ‘for’ ‘Statistical’ ‘Analysis’ ‘of’ ‘Reliability’ ‘and’ ‘Life’ ‘Data’ , John Wiley & Sons, Inc., New York, 1974.
	#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.		#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
	# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.		# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
	# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.		# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
	# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.		# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
	# Nelson, Wayne, ~~<math>Applied</math>~~ ~~<math>Life</math>~~ ~~<math>Data</math>~~ ~~<math>Analysis</math>~~ , John Wiley & Sons, Inc., New York, 1982.		# Nelson, Wayne, ‘Applied’ ‘Life’ ‘Data’ ‘Analysis’ , John Wiley & Sons, Inc., New York, 1982.
	# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.		# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
	# NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.		# NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.
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	# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.		# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
	#Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		#Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.


	~~[[Category:UNEDITED_Communications]]~~
	~~[[Category:UNEDITED_Theoretical]]~~
	~~[[Category:InProgress]]~~

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	# Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.		#Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.
	# Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.		#Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.
	# Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.		#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
	# Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
	# Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.		#Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.
	# Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
	# Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.		#Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.
	# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
	# Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004		#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
	# Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
	# Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math>		#Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math>
	<math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.		<math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.
	# Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.		#Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.
	# Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.		#Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.
	# Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.		#Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
	# Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.		#Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.
	# Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.		#Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.
	# Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.		#Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
	# Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.		#Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.
	# Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.		#Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
	# Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.		#Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
	# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.		# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
	# Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.		# Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
	# Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.		#Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
	# Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.		#Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.
	# Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.		#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.
	# Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.		#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
	# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.		# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
	# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.		# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
	# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.		# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
	# Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.		# Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.
	# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.		# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
	# NIST/SEMATECH e-Handbook of Statistical Methods,		# NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.
	http://www.itl.nist.gov/div898/handbook/, September, 2005.		#Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
	# Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.		# Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
	# Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.		# Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
	# Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.		# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
	# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.		#Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
	# Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

← Older revision		Revision as of 00:14, 25 June 2011
Line 10:		Line 10:
	# Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.		# Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.
	# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

	# Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004		# Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004

	# Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		# Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
			# Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math>
	• Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math>
	<math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.		<math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.

	# Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.		# Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.
			# Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.
	• Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.

	# Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.		# Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.

	# Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.		# Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.

	# Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.		# Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.

	# Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.		# Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.

	# Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.		# Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.

	# Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.		# Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.

	# Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.		# Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.

	# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.		# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.

	# Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.		# Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.

	# Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.		# Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.

	# Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.		# Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.

	# Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.		# Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.

	# Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.		# Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.

	# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.		# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.

	# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.		# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.

	# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.		# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.

	# Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.		# Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.

	# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.		# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.

	# NIST/SEMATECH e-Handbook of Statistical Methods,		# NIST/SEMATECH e-Handbook of Statistical Methods,
	http://www.itl.nist.gov/div898/handbook/, September, 2005.		http://www.itl.nist.gov/div898/handbook/, September, 2005.

	# Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.		# Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.

	# Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.		# Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.

	# Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.		# Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.

	# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.		# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.

	# Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		# Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

← Older revision		Revision as of 20:57, 9 May 2011
Line 5:		Line 5:
	References		References
	• Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.		• Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.

	• Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.		• Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.

	• Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.		• Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.

	• Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		• Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	• Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.		• Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.

	• Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		• Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	• Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.		• Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.

	• Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		• Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

	• Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004		• Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004

	• Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		• Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
	• Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math> <math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.
			• Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math>
			<math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.

	• Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.		• Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.

	• Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.		• Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.

	• Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.		• Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.

	• Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.		• Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.

	• Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.		• Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.

	• Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.		• Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.

	• Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.		• Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.

	• Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.		• Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.

	• Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.		• Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.

	• Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.		• Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.

	• Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.		• Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.

	• Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.		• Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.

	• Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.		• Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.

	• Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.		• Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.

	• Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.		• Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.

	• Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.		• Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.

	• Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.		• Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.

	• Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.		• Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.

	• Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.		• Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.

	• Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.		• Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.

	• NIST/SEMATECH e-Handbook of Statistical Methods,		• NIST/SEMATECH e-Handbook of Statistical Methods,
	http://www.itl.nist.gov/div898/handbook/, September, 2005.		http://www.itl.nist.gov/div898/handbook/, September, 2005.

	• Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.		• Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.

	• Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.		• Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.

	• Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.		• Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.

	• Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.		• Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.

	• Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		• Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.