Circuit Boards Example - Revision history

Lisa Hacker at 02:45, 16 August 2012

2012-08-16T02:45:39Z

← Older revision		Revision as of 02:45, 16 August 2012
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	<noinclude>{{Banner ALTA Examples}}</noinclude>		<noinclude>{{Banner ALTA Examples}}</noinclude>
			27 circuit boards were put in an accelerated life test, with temperature as the stress (or stimuli). The goal is to estimate the reliability of the circuit boards after 10 years when operating at 100ºC. The following data were obtained:
	~~Twenty-seven~~ circuit boards were put in an accelerated life test, with temperature as the stress (or stimuli). The goal is to estimate the reliability of the circuit boards after 10 years when operating at 100ºC. The following data were obtained:


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	The data were entered in the ALTA standard folio and analyzed with the Arrhenius-Weibull ~~relationship~~ model. Note that all units that did not fail in the test, but failed for unrelated reasons, were entered as suspensions. The reliability after 10 years at 100ºC is estimated to be 45.67%, as shown in the following reliability plot. This reliability value can also be obtained via the Quick Calculation Pad (QCP).		The data were entered in the ALTA standard folio and analyzed with the Arrhenius-Weibull model. Note that all units that did not fail in the test, but failed for unrelated reasons, were entered as suspensions. The reliability after 10 years at 100ºC is estimated to be 45.67%, as shown in the following reliability plot. This reliability value can also be obtained via the Quick Calculation Pad (QCP).


	[[Image:pv_ex7_5.gif\|center\|550px\|Reliability plot at use stress level]]		[[Image:pv_ex7_5.gif\|center\|550px\|Reliability plot at use stress level]]

Kate Racaza at 01:12, 15 August 2012

2012-08-15T01:12:34Z

← Older revision		Revision as of 01:12, 15 August 2012
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	~~===Circuit Boards Example===~~		<noinclude>{{Banner ALTA Examples}}</noinclude>

			Twenty-seven circuit boards were put in an accelerated life test, with temperature as the stress (or stimuli). The goal is to estimate the reliability of the circuit boards after 10 years when operating at 100ºC. The following data were obtained:

	Twenty-seven circuit boards were tested with temperature as the accelerated stress (or stimuli). The goal was to estimate the reliability after 10 years at 100ºC. The circuit boards were tested and the following data obtained:

	{\|border="1" align="center" style="border-collapse: collapse;" cellpadding="5" cellspacing="5"		{\|border="1" align="center" style="border-collapse: collapse;" cellpadding="5" cellspacing="5"
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	\|}		\|}

	The data were entered in ALTA and analyzed utilizing an Arrhenius-Weibull model. Note that all units that did not fail in the test but failed for unrelated reasons were entered as suspensions. The reliability after 10 years at 100ºC is 45.67% as shown in the next figure.

	[[Image:pv_ex7_5.gif~~\|thumb~~\|center\|550px\|Reliability plot at use stress level]]		The data were entered in the ALTA standard folio and analyzed with the Arrhenius-Weibull relationship model. Note that all units that did not fail in the test, but failed for unrelated reasons, were entered as suspensions. The reliability after 10 years at 100ºC is estimated to be 45.67%, as shown in the following reliability plot. This reliability value can also be obtained via the Quick Calculation Pad (QCP).


			[[Image:pv_ex7_5.gif\|center\|550px\|Reliability plot at use stress level]]

Kate Racaza: moved Template:Circuit Boards Example to Circuit Boards Example: incorrect namespace

2012-08-15T01:06:22Z

moved Template:Circuit Boards Example to Circuit Boards Example: incorrect namespace

← Older revision	Revision as of 01:06, 15 August 2012
(No difference)

Richard House at 06:51, 9 August 2012

2012-08-09T06:51:20Z

← Older revision		Revision as of 06:51, 9 August 2012
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	The data were entered in ALTA and analyzed utilizing an Arrhenius-Weibull model. Note that all units that did not fail in the test but failed for unrelated reasons were entered as suspensions. The reliability after 10 years at 100ºC is 45.67% as shown in the next figure.		The data were entered in ALTA and analyzed utilizing an Arrhenius-Weibull model. Note that all units that did not fail in the test but failed for unrelated reasons were entered as suspensions. The reliability after 10 years at 100ºC is 45.67% as shown in the next figure.

	[[Image:pv_ex7_5.gif\|thumb\|center\|~~500px~~\|Reliability plot at use stress level]]		[[Image:pv_ex7_5.gif\|thumb\|center\|550px\|Reliability plot at use stress level]]

Richard House at 06:51, 9 August 2012

2012-08-09T06:51:03Z

← Older revision		Revision as of 06:51, 9 August 2012
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	Twenty-seven circuit boards were tested with temperature as the accelerated stress (or stimuli). The goal was to estimate the reliability after 10 years at 100ºC. The circuit boards were tested and the following data obtained:		Twenty-seven circuit boards were tested with temperature as the accelerated stress (or stimuli). The goal was to estimate the reliability after 10 years at 100ºC. The circuit boards were tested and the following data obtained:

	~~<br>~~		{\|border="1" align="center" style="border-collapse: collapse;" cellpadding="5" cellspacing="5"
	{\|~~style=~~ border="1" align="center"
	\|-		\|-
	! colspan="3" align="center"\|Test Chamber Temperature 463K		! colspan="3" align="center"\|Test Chamber Temperature 463K
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	\|}		\|}

	~~<br>~~
	{\|~~style=~~ border="1" align="center"		{\|border="1" align="center" style="border-collapse: collapse;" cellpadding="5" cellspacing="5"
	\|-		\|-
	! colspan="3" align="center"\|Test Chamber Temperature 488K		! colspan="3" align="center"\|Test Chamber Temperature 488K
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	\|}		\|}

	~~<br>~~		The data were entered in ALTA and analyzed utilizing an Arrhenius-Weibull model. Note that all units that did not fail in the test but failed for unrelated reasons were entered as suspensions. The reliability after 10 years at 100ºC is 45.67% as shown in the next figure.


	The data were entered in ALTA and analyzed utilizing an Arrhenius-Weibull model. Note that all units that did not fail in the test but failed for unrelated reasons were entered as suspensions. The reliability after 10 years at 100ºC is 45.67% as shown in the next figure.
	~~<br>~~
	~~<br>~~
	[[Image:pv_ex7_5.gif\|thumb\|center\|500px\|Reliability plot at use stress level]]		[[Image:pv_ex7_5.gif\|thumb\|center\|500px\|Reliability plot at use stress level]]
	~~<br>~~

Chris Kahn: /* Circuit Boards Example */

2012-06-25T13:09:08Z

Circuit Boards Example

← Older revision		Revision as of 13:09, 25 June 2012
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	<br>		<br>
	<br>		<br>
	[[Image:pv_ex7_5.gif\|thumb\|center\|~~200px~~\|Reliability plot at use stress level]]		[[Image:pv_ex7_5.gif\|thumb\|center\|500px\|Reliability plot at use stress level]]
	<br>		<br>

Chuck Smith: /* Circuit Boards Example */

2012-04-25T23:24:50Z

Circuit Boards Example

← Older revision		Revision as of 23:24, 25 April 2012
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	<br>		<br>
	<br>		<br>
	[[Image:pv_ex7_5.gif\|thumb\|center\|~~400px~~\|Reliability plot at use stress level]]		[[Image:pv_ex7_5.gif\|thumb\|center\|200px\|Reliability plot at use stress level]]
	<br>		<br>

Nicolette Young: /* Circuit Boards Example */

2012-04-03T17:32:59Z

Circuit Boards Example

← Older revision		Revision as of 17:32, 3 April 2012
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	<br>		<br>
	<br>		<br>
	[[Image:pv_ex7_5.gif\|thumb\|center\|~~300px~~\|Reliability plot at use stress level]]		[[Image:pv_ex7_5.gif\|thumb\|center\|400px\|Reliability plot at use stress level]]
	<br>		<br>

Athanasios Gerokostopoulos: Created page with '===Circuit Boards Example=== Twenty-seven circuit boards were tested with temperature as the accelerated stress (or stimuli). The goal was to estimate the reliability after 10 y…'

2012-03-21T17:45:18Z

Created page with '===Circuit Boards Example=== Twenty-seven circuit boards were tested with temperature as the accelerated stress (or stimuli). The goal was to estimate the reliability after 10 y…'

New page

===Circuit Boards Example===

Twenty-seven circuit boards were tested with temperature as the accelerated stress (or stimuli). The goal was to estimate the reliability after 10 years at 100ºC. The circuit boards were tested and the following data obtained:

 
{|style= border="1" align="center"
|-
! colspan="3" align="center"|Test Chamber Temperature 463K
|-
!# of units
!Time, hr
!Observation
|-
| align="center" | 1 ||align="center" | 2,403||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 2,668||align="center" | Unrelated Failure
|-
| align="center" | 1 ||align="center" | 3,669||align="center" | Test Fixture Failure
|-
| align="center" | 1 ||align="center" | 3,863||align="center" | Failure
|-
| align="center" | 2 ||align="center" | 4,400||align="center" | Test Fixture Failure
|-
| align="center" | 2 ||align="center" | 4,767||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 5,219||align="center" | Failure
|-
| align="center" | 4 ||align="center" | 5,276||align="center" | Power Surge Failure
|-
| align="center" | 2 ||align="center" | 7,517||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 7,840||align="center" | Failure
|-
| align="center" | 2 ||align="center" | 8,025||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 8,571||align="center" | Removed - Test Terminated
|}

 
{|style= border="1" align="center"
|-
! colspan="3" align="center"|Test Chamber Temperature 488K
|-
!# of units
!Time, hr
!Observation
|-
| align="center" | 2 ||align="center" | 346||align="center" | Power Regulator Failure
|-
| align="center" | 1 ||align="center" | 1,416||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 2,197||align="center" | Unrelated Failure
|-
| align="center" | 1 ||align="center" | 2,533||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 2,630||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 2,701||align="center" | Test Fixture Failure
|-
| align="center" | 1 ||align="center" | 3,000||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 3,489||align="center" | Failure
|-
| align="center" | 1 ||align="center" | 6,720||align="center" | Removed - Test Terminated
|}

 

The data were entered in ALTA and analyzed utilizing an Arrhenius-Weibull model. Note that all units that did not fail in the test but failed for unrelated reasons were entered as suspensions. The reliability after 10 years at 100ºC is 45.67% as shown in the next figure.
 
 
[[Image:pv_ex7_5.gif|thumb|center|300px|Reliability plot at use stress level]]