ALTA ALTA Standard Folio Data GER-Lognormal: Difference between revisions

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The ALTA standard folio is used to perform quantitative accelerated life testing data analysis. In this analysis, the engineer extrapolates a product’s failure behavior at normal conditions from life data obtained at accelerated stress levels. Since products fail more quickly at accelerated stress levels, this sort of analysis allows the engineer to obtain reliability information about a product (e.g., mean life, probability of failure at a specific time, etc.) in a shorter time.
The generalized Eyring relationship is used when temperature and a second non-thermal stress (e.g. voltage) are the accelerated stresses of a test and their interaction is also of interest.
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Revision as of 18:37, 16 April 2012

Standard Folio Generalized Eyring-Lognormal

The generalized Eyring relationship is used when temperature and a second non-thermal stress (e.g. voltage) are the accelerated stresses of a test and their interaction is also of interest.


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