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  • This example validates the results for test-fix-test data (failure terminated) in RGA. ...ard IEC 61164 (Reliability Growth in Product Design and Test – Statistical Test and Estimation Methods), Example 2 – Case 1, pg. 30.
    2 KB (235 words) - 18:27, 28 September 2015
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Find-Test Data}} This example validates the results for test-fix-find-test data in RGA.
    2 KB (268 words) - 18:27, 28 September 2015
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Test Data}} This example validates the results for test-fix-test data (time terminated) in RGA.
    2 KB (227 words) - 18:26, 28 September 2015
  • 27 bytes (3 words) - 01:14, 23 August 2012
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Find-Test Data}} This example validates the results for test-find-test data in RGA.
    3 KB (392 words) - 18:26, 28 September 2015
  • #What is the rate at which unique BD modes are being generated during this test? #If the test continues for an additional 50 hours, what is the minimum number of new uni
    5 KB (727 words) - 21:23, 18 September 2023
  • ...<math>{{N}_{j}}\,\!</math>, and the total number of BD failures during the test is <math>{{N}_{BD}}=\underset{j=1}{\overset{M}{\mathop{\sum }}}\,{{N}_{j}}\ |colspan="7" style="text-align:center"|'''Test-Find-Test Data'''
    6 KB (731 words) - 21:30, 18 September 2023
  • 27 bytes (3 words) - 01:21, 23 August 2012
  • 23 bytes (3 words) - 20:04, 25 June 2015
  • [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
    2 KB (231 words) - 19:04, 18 September 2023
  • 37 bytes (5 words) - 06:38, 13 August 2012
  • 26 bytes (3 words) - 21:25, 23 June 2015
  • 35 bytes (4 words) - 21:13, 24 May 2013
  • {{template:LDABOOK|22|Reliability Test Design}} ...rate if the product reliability can meet the requirement. For this type of test design, four methods are supported in Weibull++:
    22 KB (3,517 words) - 21:22, 10 December 2015
  • ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
    3 KB (523 words) - 19:04, 18 September 2023
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:02, 29 June 2012
  • 82 bytes (11 words) - 09:01, 10 August 2012
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:04, 29 June 2012
  • 23 bytes (3 words) - 22:20, 15 September 2023
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:02, 29 June 2012

Page text matches

  • ...e growth strategy that can include corrective actions performed during the test, as well as delayed corrective actions.
    2 KB (237 words) - 22:56, 23 April 2015
  • ...at AMD and main roles is product qualification which involves reliability test (FMAX, HTOL, etc.).
    249 bytes (33 words) - 04:18, 30 August 2012
  • ===Test-Find-Test Data=== {{:Test-Find-Test_Data_Example}}
    1 KB (154 words) - 21:14, 18 September 2023
  • |{{Font|Test Design Folio|11|tahoma|bold|gray}} ...folio can assist you in determining the cumulative test time or number of test systems required in order to demonstrate a specific MTBF or failure intensi
    1 KB (184 words) - 15:59, 30 June 2015
  • | valign="middle" |{{Font| Reliability Demonstration Test Tool|11|tahoma|bold|gray}} ...lving for various values related to the test such as sample size, required test time, the demonstrated reliability and the confidence level at which the ta
    1 KB (209 words) - 23:15, 17 April 2015
  • ...to multiple models, the Common Beta Hypothesis test and the Laplace Trend test are both presented in Appendix B. The Cramér-von Mises and Chi-Squared tes {{cramer-con mises test for individual failure times}}
    1 KB (204 words) - 17:00, 6 January 2012
  • ==Missile Launch Test Example== ===Missile Launch Test with Modes===
    893 bytes (105 words) - 20:36, 18 September 2023
  • | valign="middle" |{{Font|Test Time vs. Test Units Plot|11|tahoma|bold|gray}} ...f failures; this depicts how the allowed number of failures influences the test time and the required sample size.
    1 KB (207 words) - 23:18, 17 April 2015
  • ...e test is also not predefined, and it can be continuously updated with new test data.
    2 KB (299 words) - 22:31, 23 April 2015
  • | valign="middle" |{{Font|ALTA Test Plan Utility|11|tahoma|bold|gray}} ...est plan with recommendations for what stress levels should be used in the test and how many units should be tested at each stress level.
    2 KB (233 words) - 16:40, 20 April 2015
  • ...nce. The available time for the demonstration test is 4,000 hours for each test unit. Assuming zero failures are allowed, what is the required number of un ...en that in order to demonstrate a 10,000 hours MTBF with 80% confidence, 5 test units will be required.
    1 KB (193 words) - 20:55, 18 September 2023
  • ...e (or <math>CL=0.9\,\!</math>) if no more than 2 failures occur during the test (<math>f=2\,\!</math>). The chi-squared value can be determined from tables This means that 16,374 hours of total test time needs to be accumulated with no more than two failures in order to dem
    1 KB (196 words) - 18:55, 18 September 2023
  • ...ototype of a system was tested with design changes incorporated during the test. A total of 12 failures occurred. The data set is given in the following ta |+'''Developmental Test Data'''
    2 KB (222 words) - 21:16, 18 September 2023
  • ...!</math>. We want to determine the number of units to test for <math>{{t}_{TEST}}=60\,\!</math> hours to demonstrate this goal. ...e as the reliability demonstration example. Next, the value of <math>{{R}_{TEST}}\,\!</math> is calculated as:
    2 KB (360 words) - 18:55, 18 September 2023
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:05, 29 June 2012
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:04, 29 June 2012
  • #REDIRECT [[Reliability Test Design]]
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  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:09, 29 June 2012
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:03, 29 June 2012
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:05, 29 June 2012
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