Generalized Eyring Example

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This example appears in the Accelerated Life Testing Data Analysis Reference book.


The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the [math]B10\,\![/math] life at the use conditions of [math]T=350K\,\![/math] and [math]H=0.3\,\![/math]. The data set is modeled using the lognormal distribution and the generalized Eyring model.

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The probability plot at the use conditions is shown next.

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The [math]B10\,\![/math] information is estimated to be 1967.2 hours, as shown next.

TempBX.png