# Generalized Eyring Example

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*This example appears in the Accelerated Life Testing Data Analysis Reference book.*

The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the [math]B10\,\![/math] life at the use conditions of [math]T=350K\,\![/math] and [math]H=0.3\,\![/math]. The data set is modeled using the lognormal distribution and the generalized Eyring model.

The probability plot at the use conditions is shown next.

The [math]B10\,\![/math] information is estimated to be 1967.2 hours, as shown next.