# Temperature-Nonthermal Relationship Example

This example appears in the Accelerated Life Testing Data Analysis Reference book.

12 electronic devices were put into a continuous accelerated life test and the following data were collected.

Using ALTA and the T-NT lognormal model, the following parameters were obtained:

\begin{align} \widehat{Std}=\ & 0.182558 \\ \widehat{B}=\ & 3729.650303 \\ \widehat{C}=\ & 0.035292 \\ \widehat{n}=\ & 0.776797 \end{align}\,\!

A probability plot, with the 2-sided 90% confidence bounds for the use stress levels of 323K and 2V, is shown next.

An acceleration factor plot, in which one of the stresses must be kept constant, can also be obtained. For example, in the following plot, the acceleration factor is plotted versus temperature given a constant voltage of 2V.