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• Test-Fix-Test Data (Failure Terminated) Reference Example
  This example validates the results for test-fix-test data (failure terminated) in RGA. ...ard IEC 61164 (Reliability Growth in Product Design and Test – Statistical Test and Estimation Methods), Example 2 – Case 1, pg. 30.
  2 KB (235 words) - 18:27, 28 September 2015
• Test-Fix-Find-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Find-Test Data}} This example validates the results for test-fix-find-test data in RGA.
  2 KB (268 words) - 18:27, 28 September 2015
• Test-Fix-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Test Data}} This example validates the results for test-fix-test data (time terminated) in RGA.
  2 KB (227 words) - 18:26, 28 September 2015
• Test-Find-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Find-Test Data}} This example validates the results for test-find-test data in RGA.
  3 KB (392 words) - 18:26, 28 September 2015
• Test-Fix-Find-Test Data Example
  #What is the rate at which unique BD modes are being generated during this test? #If the test continues for an additional 50 hours, what is the minimum number of new uni
  5 KB (727 words) - 21:23, 18 September 2023
• Test-Find-Test Data Example
  ...<math>{{N}_{j}}\,\!</math>, and the total number of BD failures during the test is <math>{{N}_{BD}}=\underset{j=1}{\overset{M}{\mathop{\sum }}}\,{{N}_{j}}\ |colspan="7" style="text-align:center"|'''Test-Find-Test Data'''
  6 KB (731 words) - 21:30, 18 September 2023
• Test Incident
  23 bytes (3 words) - 20:04, 25 June 2015
• ALTA Test Plan Example
  ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
  3 KB (523 words) - 19:04, 18 September 2023
• Likelihood Ratio Test
  26 bytes (3 words) - 21:25, 23 June 2015
• Reliability Test Design
  {{template:LDABOOK|22|Reliability Test Design}} ...rate if the product reliability can meet the requirement. For this type of test design, four methods are supported in Weibull++:
  22 KB (3,517 words) - 21:22, 10 December 2015
• ALTA Test Plan
  35 bytes (4 words) - 21:13, 24 May 2013
• Likelihood Ratio Test Example
  [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
  2 KB (231 words) - 19:04, 18 September 2023
• Test Design Articles
  23 bytes (3 words) - 22:20, 15 September 2023
• Simulation for Test Design
  80 bytes (10 words) - 00:21, 30 June 2015
• Weibull++ Test Design RDT
  60 bytes (8 words) - 21:25, 10 July 2015
• Bayesian Nonparametric Test Design
  37 bytes (4 words) - 08:56, 9 August 2012
• Accelerated Life Test Plans
  <noinclude>{{Template:ALTABOOK|Additional Tools|Accelerated Life Test Plans}}</noinclude> ...of the different stress types' levels). This section presents some common test plans for one-stress and two-stress accelerated tests.
  16 KB (2,516 words) - 19:20, 15 September 2023
• Logistic Model - Missile Launch Test Example
  ...t, it was recorded as a failure. Note that, at this development stage, the test did not consider whether or not the target was destroyed.
  2 KB (283 words) - 21:23, 18 September 2023
• Parametric Binomial Reliability Demonstration Test
  This example validates the results for a parametric binomial test design in Weibull++. ...1,000 hours with 50% confidence, 15 samples are tested for a zero failure test. How many hours should these samples be tested? The failure times are assum
  787 bytes (109 words) - 16:25, 28 September 2015
• Non-Parametric Binomial Test Design Example
  A reliability engineer wants to design a zero-failure demonstration test in order to demonstrate a reliability of 80% at a 90% confidence level. Use By substituting <math>f=0\,\!</math> (since it a zero-failure test) the non-parametric binomial equation becomes:
  2 KB (266 words) - 18:55, 18 September 2023
• Weibull++ Test Design RDT PlotTable
  70 bytes (9 words) - 21:26, 10 July 2015
• Weibull++ Test Design Difference Detection Matrix
  84 bytes (10 words) - 21:22, 10 July 2015
• Non-Parametric Binomial Reliability Demonstration Test
  This example validates the results for a non-parametric binomial test design in Weibull++.
  791 bytes (107 words) - 16:24, 28 September 2015
• Exponential Chi-Squared Reliability Demonstration Test
  ...dates the results for an exponential chi-squared reliability demonstration test design in Weibull++. ...s tested for a total of 2,000 hours, and three failures were observed. The test was time-truncated. Assuming a constant failure rate, what is the demonstra
  1 KB (144 words) - 16:25, 28 September 2015
• Test Design Using Expected Failure Time Plots
  #REDIRECT [[Reliability Test Design]]
  37 bytes (4 words) - 08:04, 29 June 2012
• Optimal Test Plan for Two Stresses
  This example validates the results for the 3 level optimum test plan with two stresses in ALTA. ...e stress in volts/mm. The planning values for the model parameters for the test plan are:
  6 KB (859 words) - 18:24, 28 September 2015
• Weibull++ Test Design Expected Failure Time
  78 bytes (10 words) - 21:24, 10 July 2015
• Repairable System Test Design Example - Solve for Time
  ...est is <math>m=6\,\!</math> and that the number of allowed failures in the test is <math>r=2.\,\!</math> We can then solve for the required test time, <math>T,\,\!</math> for each system:
  3 KB (384 words) - 20:55, 18 September 2023
• Reliability Demonstration Test Design for Repairable Systems
  {{template:RGA BOOK|8|Reliability Demonstration Test Design for Repairable Systems}} ...ration tests for repairable systems. For example, you may want to design a test to demonstrate a specific cumulative MTBF for a specific operating period a
  2 KB (388 words) - 15:09, 14 February 2019
• Three Level Compromise Test Plan for One Stress
  This example validates the results for the 3 level best compromise test plan with one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
  4 KB (686 words) - 18:24, 28 September 2015
• Two Level Optimum Test Plan for One Stress
  This example validates the results for the 2 level statistically optimum test plan for one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
  3 KB (471 words) - 18:23, 28 September 2015
• Repairable System Test Design Example - Solve for Sample Size
  ...nce. The available time for the demonstration test is 4,000 hours for each test unit. Assuming zero failures are allowed, what is the required number of un ...en that in order to demonstrate a 10,000 hours MTBF with 80% confidence, 5 test units will be required.
  1 KB (193 words) - 20:55, 18 September 2023
• Example: Test design to demonstrate reliability given a stress distribution
  36 bytes (5 words) - 00:04, 30 June 2015
• Reliability Demonstration Test Design for Repairable Systems Articles
  23 bytes (3 words) - 22:54, 15 September 2023

Page text matches

• Crow Extended Model Examples
  ===Test-Find-Test Data=== {{:Test-Find-Test_Data_Example}}
  1 KB (154 words) - 21:14, 18 September 2023
• Logistic Model Examples
  ==Missile Launch Test Example== ===Missile Launch Test with Modes===
  893 bytes (105 words) - 20:36, 18 September 2023
• Repairable System Test Design Example - Solve for Sample Size
  ...nce. The available time for the demonstration test is 4,000 hours for each test unit. Assuming zero failures are allowed, what is the required number of un ...en that in order to demonstrate a 10,000 hours MTBF with 80% confidence, 5 test units will be required.
  1 KB (193 words) - 20:55, 18 September 2023
• Exponential Chi-Squared Example
  ...e (or <math>CL=0.9\,\!</math>) if no more than 2 failures occur during the test (<math>f=2\,\!</math>). The chi-squared value can be determined from tables This means that 16,374 hours of total test time needs to be accumulated with no more than two failures in order to dem
  1 KB (196 words) - 18:55, 18 September 2023
• Failure Times - Duane Example
  ...ototype of a system was tested with design changes incorporated during the test. A total of 12 failures occurred. The data set is given in the following ta |+'''Developmental Test Data'''
  2 KB (222 words) - 21:16, 18 September 2023
• Parametric Binomial Example - Demonstrate MTTF
  ...!</math>. We want to determine the number of units to test for <math>{{t}_{TEST}}=60\,\!</math> hours to demonstrate this goal. ...e as the reliability demonstration example. Next, the value of <math>{{R}_{TEST}}\,\!</math> is calculated as:
  2 KB (360 words) - 18:55, 18 September 2023
• Test Design Using Expected Failure Time Plots
  #REDIRECT [[Reliability Test Design]]
  37 bytes (4 words) - 08:04, 29 June 2012
• Difference Detection Matrix
  #REDIRECT [[Reliability Test Design]]
  37 bytes (4 words) - 08:09, 29 June 2012
• Parametric Binomial Example - Demonstrate Reliability
  ...=100\,\!</math> hours with a 95% confidence if no failure occur during the test. We will assume a Weibull distribution with a shape parameter <math>\beta = '''Determining Units for Available Test Time'''
  3 KB (470 words) - 18:30, 18 September 2023
• Sequential Data - Duane Example
  #What is the instantaneous Reliability at the end of the test? #How many additional test runs with a one-sided 90% confidence level are required to meet an instanta
  2 KB (232 words) - 21:22, 18 September 2023
• Circuit Boards Example
  27 circuit boards were put in an accelerated life test, with temperature as the stress (or stimuli). The goal is to estimate the r ! colspan="3" align="center"|Test Chamber Temperature 463K
  3 KB (350 words) - 02:45, 16 August 2012
• ALTA Test Plan Example
  ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
  3 KB (523 words) - 19:04, 18 September 2023
• Non-Parametric Binomial Test Design Example
  A reliability engineer wants to design a zero-failure demonstration test in order to demonstrate a reliability of 80% at a 90% confidence level. Use By substituting <math>f=0\,\!</math> (since it a zero-failure test) the non-parametric binomial equation becomes:
  2 KB (266 words) - 18:55, 18 September 2023
• Expected Failure Times Plot Example
  ...e allocated for the test, and the test engineers want to know how long the test will last if all the units are tested to failure. Based on previous experim ...see the upper bound of the last failure is about 955 hours. Therefore, the test probably will last for around 955 hours.
  2 KB (233 words) - 18:55, 18 September 2023
• Interval Data Example
  ...test chamber contains 50 units and is set to a different temperature. The test is performed continuously for 15 weeks, but monitored only on a weekly basi ...ath> life (in hours) of the electronic device. The data obtained from the test are recorded in an ALTA standard folio, using the interval data format, as
  2 KB (254 words) - 01:54, 15 August 2012
• Multi-Phase Example
  ...evaluation every 1,000 hours. The cumulative test times at the end of each test phase are 5,000; 15,000; 25,000; 35,000; 45,000 and 60,000 hours. ...ng|center|400px|Portion of test results for a six-phase reliability growth test program.]]
  3 KB (455 words) - 21:20, 18 September 2023
• Likelihood Ratio Test Example
  [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
  2 KB (231 words) - 19:04, 18 September 2023
• Two Level Optimum Test Plan for One Stress
  This example validates the results for the 2 level statistically optimum test plan for one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
  3 KB (471 words) - 18:23, 28 September 2015
• Edit Existing Synthesis Resources/VBA
  ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
  1 KB (142 words) - 18:16, 3 April 2017
• Reliability Demonstration Test Design for Repairable Systems
  {{template:RGA BOOK|8|Reliability Demonstration Test Design for Repairable Systems}} ...ration tests for repairable systems. For example, you may want to design a test to demonstrate a specific cumulative MTBF for a specific operating period a
  2 KB (388 words) - 15:09, 14 February 2019
• Parametric Binomial Reliability Demonstration Test
  This example validates the results for a parametric binomial test design in Weibull++. ...1,000 hours with 50% confidence, 15 samples are tested for a zero failure test. How many hours should these samples be tested? The failure times are assum
  787 bytes (109 words) - 16:25, 28 September 2015
• Test-Fix-Test Data (Failure Terminated) Reference Example
  This example validates the results for test-fix-test data (failure terminated) in RGA. ...ard IEC 61164 (Reliability Growth in Product Design and Test – Statistical Test and Estimation Methods), Example 2 – Case 1, pg. 30.
  2 KB (235 words) - 18:27, 28 September 2015
• RGA SimuMatic Example
  ...a for the previous version, the expected beta and lambda parameters of the test are 0.5 and 0.3, respectively. Do the following: ...ded 90% lower confidence bound on the instantaneous MTBF at the end of the test.
  3 KB (486 words) - 20:55, 18 September 2023
• Three Level Compromise Test Plan for One Stress
  This example validates the results for the 3 level best compromise test plan with one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
  4 KB (686 words) - 18:24, 28 September 2015
• Test-Fix-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Test Data}} This example validates the results for test-fix-test data (time terminated) in RGA.
  2 KB (227 words) - 18:26, 28 September 2015
• Repairable System Test Design Example - Solve for Time
  ...est is <math>m=6\,\!</math> and that the number of allowed failures in the test is <math>r=2.\,\!</math> We can then solve for the required test time, <math>T,\,\!</math> for each system:
  3 KB (384 words) - 20:55, 18 September 2023
• Mechanical Components Example
  ...Arrhenius-Weibull model to the observed data and analyze the result of the test. The following times-to-failure data were observed. :* The stress values used in the test were well within the "specification limits" for the product (see discussion
  2 KB (248 words) - 02:56, 16 August 2012
• Mixed Data - Crow-AMSAA Example
  ...idual trial by trial. The table below shows the data set obtained from the test. The first column specifies the number of failures that occurred in each in ...aneous reliability and the 2-sided 90% confidence bounds at the end of the test?
  2 KB (321 words) - 21:21, 18 September 2023
• Exponential Chi-Squared Reliability Demonstration Test
  ...dates the results for an exponential chi-squared reliability demonstration test design in Weibull++. ...s tested for a total of 2,000 hours, and three failures were observed. The test was time-truncated. Assuming a constant failure rate, what is the demonstra
  1 KB (144 words) - 16:25, 28 September 2015
• Difference Detection Matrix Example
  ...e are two design options for a new product. The engineers need to design a test that compares the reliability performance of these two options. The reliabi ...nitial setup, set the sample size for each design to '''20''', and use two test durations of '''3,000''' and '''5,000''' hours. The following picture shows
  4 KB (610 words) - 18:56, 18 September 2023
• Growth Plan for Seven Phases
  *The test will be conducted in seven phases. The cumulative phase end times are <math ...plan is to test 1,000 hours per week, so the average fix delay in terms of test hours for phases 1 and 2 is <math>{{L}_{1}}=1000\,\!</math> and <math>{{L}_
  4 KB (744 words) - 20:54, 18 September 2023
• Operational Testing
  ...xes, BD modes (test-find-test), are allowed. BC modes and fixes during the test cannot be entered. In this scenario, you want a stable system such that the
  2 KB (252 words) - 18:31, 24 April 2014
• Grouped per Configuration - Lloyd-Lipow Model
  A 15-stage reliability development test program was performed. The grouped per configuration data set is shown in t #What is the maximum reliability attained as the number of test stages approaches infinity?
  2 KB (223 words) - 21:22, 18 September 2023
• Crow-AMSAA Parameter Estimation Example
  ...the test. The following table presents the data collected over the entire test. Find the Crow-AMSAA parameters and the intensity function using maximum li <center>'''Developmental Test Data''' </center>
  2 KB (242 words) - 21:21, 18 September 2023
• Optimal Test Plan for Two Stresses
  This example validates the results for the 3 level optimum test plan with two stresses in ALTA. ...e stress in volts/mm. The planning values for the model parameters for the test plan are:
  6 KB (859 words) - 18:24, 28 September 2015
• Non-Parametric Bayesian - Subsystem Tests
  You can use the non-parametric Bayesian method to design a test for a system using information from tests on its subsystems. For example, s ...s prior distribution, we now can design a system reliability demonstration test by calculating system reliability ''R'', confidence level ''CL'', number of
  3 KB (403 words) - 18:55, 18 September 2023
• Logistic Model - Missile Launch Test Example
  ...t, it was recorded as a failure. Note that, at this development stage, the test did not consider whether or not the target was destroyed.
  2 KB (283 words) - 21:23, 18 September 2023
• RGA Monte Carlo Simulation Example
  ...imes-to-failure for the upcoming test. The purpose is to explore different test durations in order to demonstrate an MTBF of 200 hours. ...urrent" data sheet and then set the number of systems to 3. Initially, the test is set to be time terminated with 2,000 operating hours per system, for a t
  4 KB (575 words) - 20:54, 18 September 2023
• CAction Class
  ...escription of the assumptions of the test plan, if the action is part of a test plan. '''String'''. ...he description of the results of the test plan, if the action is part of a test plan. '''String'''.
  10 KB (1,473 words) - 20:13, 29 April 2016
• Calculate Results from a Model/VBA
  ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
  2 KB (265 words) - 18:23, 3 April 2017
• Test-Find-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Find-Test Data}} This example validates the results for test-find-test data in RGA.
  3 KB (392 words) - 18:26, 28 September 2015
• Add New Synthesis Resources to a Repository/VBA
  ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
  1 KB (146 words) - 18:08, 3 April 2017
• Growth Plan for Four Phases
  ...> and <math>{{T}_{4}}=100000\,\!</math>. The average fix delay in terms of test hours for each phase is: <math>{{L}_{1}}=10000\,\!</math>, <math>{{L}_{2}}= ...gram was initiated and actual test data from phase 1 is now available. The test data were analyzed using the Crow Extended - Continuous Evaluation model an
  4 KB (712 words) - 20:53, 18 September 2023
• Test-Fix-Find-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Find-Test Data}} This example validates the results for test-fix-find-test data in RGA.
  2 KB (268 words) - 18:27, 28 September 2015
• ReliaSoft's Alternate Ranking Method (RRM) Step-by-Step Example
  Consider the following test data, as shown in the following Table B.1.
  369 bytes (56 words) - 23:49, 27 June 2011
• Crow Extended Confidence Bounds Example
  ...include>shown in the [[Test-Find-Test_Data_Example|Crow Extended Test-Find-Test Data example]]</noinclude><includeonly>given above</includeonly>.
  4 KB (487 words) - 21:29, 18 September 2023
• Paper Clip Example
  ...that the two accelerated bend stresses are 90º and 180º. For the 90º bend, test the paper clip using the following procedure. Use a similar procedure for t '''Paper Clip Test'''
  3 KB (539 words) - 07:40, 7 August 2012
• Test-Fix-Find-Test Data Example
  #What is the rate at which unique BD modes are being generated during this test? #If the test continues for an additional 50 hours, what is the minimum number of new uni
  5 KB (727 words) - 21:23, 18 September 2023
• Hypothesis Tests
  ==Common Beta Hypothesis Test== ...rences|[17]]], suppose that <math>K\,\!</math> number of systems are under test. Each system has an intensity function given by:
  8 KB (1,083 words) - 20:40, 18 September 2023
• Weibull++ SimuMatic
  ...a test, we must determine the sample size to test as well as the expected test duration. The next simple example illustrates the methods available in Simu ...ed until we arrive at an acceptable test design (i.e., number of units and test duration).
  6 KB (953 words) - 19:16, 15 September 2023