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  • This example validates the results for test-fix-test data (failure terminated) in RGA. ...ard IEC 61164 (Reliability Growth in Product Design and Test – Statistical Test and Estimation Methods), Example 2 – Case 1, pg. 30.
    2 KB (235 words) - 18:27, 28 September 2015
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Find-Test Data}} This example validates the results for test-fix-find-test data in RGA.
    2 KB (268 words) - 18:27, 28 September 2015
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Test Data}} This example validates the results for test-fix-test data (time terminated) in RGA.
    2 KB (227 words) - 18:26, 28 September 2015
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Find-Test Data}} This example validates the results for test-find-test data in RGA.
    3 KB (392 words) - 18:26, 28 September 2015
  • #What is the rate at which unique BD modes are being generated during this test? #If the test continues for an additional 50 hours, what is the minimum number of new uni
    5 KB (727 words) - 21:23, 18 September 2023
  • ...<math>{{N}_{j}}\,\!</math>, and the total number of BD failures during the test is <math>{{N}_{BD}}=\underset{j=1}{\overset{M}{\mathop{\sum }}}\,{{N}_{j}}\ |colspan="7" style="text-align:center"|'''Test-Find-Test Data'''
    6 KB (731 words) - 21:30, 18 September 2023
  • 23 bytes (3 words) - 20:04, 25 June 2015
  • ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
    3 KB (523 words) - 19:04, 18 September 2023
  • 26 bytes (3 words) - 21:25, 23 June 2015
  • {{template:LDABOOK|22|Reliability Test Design}} ...rate if the product reliability can meet the requirement. For this type of test design, four methods are supported in Weibull++:
    22 KB (3,517 words) - 21:22, 10 December 2015
  • 35 bytes (4 words) - 21:13, 24 May 2013
  • [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
    2 KB (231 words) - 19:04, 18 September 2023
  • 23 bytes (3 words) - 22:20, 15 September 2023
  • 80 bytes (10 words) - 00:21, 30 June 2015
  • 60 bytes (8 words) - 21:25, 10 July 2015
  • 37 bytes (4 words) - 08:56, 9 August 2012
  • <noinclude>{{Template:ALTABOOK|Additional Tools|Accelerated Life Test Plans}}</noinclude> ...of the different stress types' levels). This section presents some common test plans for one-stress and two-stress accelerated tests.
    16 KB (2,516 words) - 19:20, 15 September 2023
  • ...t, it was recorded as a failure. Note that, at this development stage, the test did not consider whether or not the target was destroyed.
    2 KB (283 words) - 21:23, 18 September 2023
  • This example validates the results for a parametric binomial test design in Weibull++. ...1,000 hours with 50% confidence, 15 samples are tested for a zero failure test. How many hours should these samples be tested? The failure times are assum
    787 bytes (109 words) - 16:25, 28 September 2015
  • A reliability engineer wants to design a zero-failure demonstration test in order to demonstrate a reliability of 80% at a 90% confidence level. Use By substituting <math>f=0\,\!</math> (since it a zero-failure test) the non-parametric binomial equation becomes:
    2 KB (266 words) - 18:55, 18 September 2023
  • 70 bytes (9 words) - 21:26, 10 July 2015
  • 84 bytes (10 words) - 21:22, 10 July 2015
  • This example validates the results for a non-parametric binomial test design in Weibull++.
    791 bytes (107 words) - 16:24, 28 September 2015
  • ...dates the results for an exponential chi-squared reliability demonstration test design in Weibull++. ...s tested for a total of 2,000 hours, and three failures were observed. The test was time-truncated. Assuming a constant failure rate, what is the demonstra
    1 KB (144 words) - 16:25, 28 September 2015
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:04, 29 June 2012
  • This example validates the results for the 3 level optimum test plan with two stresses in ALTA. ...e stress in volts/mm. The planning values for the model parameters for the test plan are:
    6 KB (859 words) - 18:24, 28 September 2015
  • 78 bytes (10 words) - 21:24, 10 July 2015
  • ...est is <math>m=6\,\!</math> and that the number of allowed failures in the test is <math>r=2.\,\!</math> We can then solve for the required test time, <math>T,\,\!</math> for each system:
    3 KB (384 words) - 20:55, 18 September 2023
  • {{template:RGA BOOK|8|Reliability Demonstration Test Design for Repairable Systems}} ...ration tests for repairable systems. For example, you may want to design a test to demonstrate a specific cumulative MTBF for a specific operating period a
    2 KB (388 words) - 15:09, 14 February 2019
  • This example validates the results for the 3 level best compromise test plan with one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
    4 KB (686 words) - 18:24, 28 September 2015
  • This example validates the results for the 2 level statistically optimum test plan for one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
    3 KB (471 words) - 18:23, 28 September 2015
  • ...nce. The available time for the demonstration test is 4,000 hours for each test unit. Assuming zero failures are allowed, what is the required number of un ...en that in order to demonstrate a 10,000 hours MTBF with 80% confidence, 5 test units will be required.
    1 KB (193 words) - 20:55, 18 September 2023
  • 36 bytes (5 words) - 00:04, 30 June 2015
  • 23 bytes (3 words) - 22:54, 15 September 2023

Page text matches

  • ===Test-Find-Test Data=== {{:Test-Find-Test_Data_Example}}
    1 KB (154 words) - 21:14, 18 September 2023
  • ==Missile Launch Test Example== ===Missile Launch Test with Modes===
    893 bytes (105 words) - 20:36, 18 September 2023
  • ...nce. The available time for the demonstration test is 4,000 hours for each test unit. Assuming zero failures are allowed, what is the required number of un ...en that in order to demonstrate a 10,000 hours MTBF with 80% confidence, 5 test units will be required.
    1 KB (193 words) - 20:55, 18 September 2023
  • ...e (or <math>CL=0.9\,\!</math>) if no more than 2 failures occur during the test (<math>f=2\,\!</math>). The chi-squared value can be determined from tables This means that 16,374 hours of total test time needs to be accumulated with no more than two failures in order to dem
    1 KB (196 words) - 18:55, 18 September 2023
  • ...ototype of a system was tested with design changes incorporated during the test. A total of 12 failures occurred. The data set is given in the following ta |+'''Developmental Test Data'''
    2 KB (222 words) - 21:16, 18 September 2023
  • ...!</math>. We want to determine the number of units to test for <math>{{t}_{TEST}}=60\,\!</math> hours to demonstrate this goal. ...e as the reliability demonstration example. Next, the value of <math>{{R}_{TEST}}\,\!</math> is calculated as:
    2 KB (360 words) - 18:55, 18 September 2023
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:04, 29 June 2012
  • #REDIRECT [[Reliability Test Design]]
    37 bytes (4 words) - 08:09, 29 June 2012
  • ...=100\,\!</math> hours with a 95% confidence if no failure occur during the test. We will assume a Weibull distribution with a shape parameter <math>\beta = '''Determining Units for Available Test Time'''
    3 KB (470 words) - 18:30, 18 September 2023
  • #What is the instantaneous Reliability at the end of the test? #How many additional test runs with a one-sided 90% confidence level are required to meet an instanta
    2 KB (232 words) - 21:22, 18 September 2023
  • 27 circuit boards were put in an accelerated life test, with temperature as the stress (or stimuli). The goal is to estimate the r ! colspan="3" align="center"|Test Chamber Temperature 463K
    3 KB (350 words) - 02:45, 16 August 2012
  • ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
    3 KB (523 words) - 19:04, 18 September 2023
  • A reliability engineer wants to design a zero-failure demonstration test in order to demonstrate a reliability of 80% at a 90% confidence level. Use By substituting <math>f=0\,\!</math> (since it a zero-failure test) the non-parametric binomial equation becomes:
    2 KB (266 words) - 18:55, 18 September 2023
  • ...e allocated for the test, and the test engineers want to know how long the test will last if all the units are tested to failure. Based on previous experim ...see the upper bound of the last failure is about 955 hours. Therefore, the test probably will last for around 955 hours.
    2 KB (233 words) - 18:55, 18 September 2023
  • ...test chamber contains 50 units and is set to a different temperature. The test is performed continuously for 15 weeks, but monitored only on a weekly basi ...ath> life (in hours) of the electronic device. The data obtained from the test are recorded in an ALTA standard folio, using the interval data format, as
    2 KB (254 words) - 01:54, 15 August 2012
  • ...evaluation every 1,000 hours. The cumulative test times at the end of each test phase are 5,000; 15,000; 25,000; 35,000; 45,000 and 60,000 hours. ...ng|center|400px|Portion of test results for a six-phase reliability growth test program.]]
    3 KB (455 words) - 21:20, 18 September 2023
  • [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
    2 KB (231 words) - 19:04, 18 September 2023
  • This example validates the results for the 2 level statistically optimum test plan for one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
    3 KB (471 words) - 18:23, 28 September 2015
  • ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
    1 KB (142 words) - 18:16, 3 April 2017
  • {{template:RGA BOOK|8|Reliability Demonstration Test Design for Repairable Systems}} ...ration tests for repairable systems. For example, you may want to design a test to demonstrate a specific cumulative MTBF for a specific operating period a
    2 KB (388 words) - 15:09, 14 February 2019
  • This example validates the results for a parametric binomial test design in Weibull++. ...1,000 hours with 50% confidence, 15 samples are tested for a zero failure test. How many hours should these samples be tested? The failure times are assum
    787 bytes (109 words) - 16:25, 28 September 2015
  • This example validates the results for test-fix-test data (failure terminated) in RGA. ...ard IEC 61164 (Reliability Growth in Product Design and Test – Statistical Test and Estimation Methods), Example 2 – Case 1, pg. 30.
    2 KB (235 words) - 18:27, 28 September 2015
  • ...a for the previous version, the expected beta and lambda parameters of the test are 0.5 and 0.3, respectively. Do the following: ...ded 90% lower confidence bound on the instantaneous MTBF at the end of the test.
    3 KB (486 words) - 20:55, 18 September 2023
  • This example validates the results for the 3 level best compromise test plan with one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
    4 KB (686 words) - 18:24, 28 September 2015
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Test Data}} This example validates the results for test-fix-test data (time terminated) in RGA.
    2 KB (227 words) - 18:26, 28 September 2015
  • ...est is <math>m=6\,\!</math> and that the number of allowed failures in the test is <math>r=2.\,\!</math> We can then solve for the required test time, <math>T,\,\!</math> for each system:
    3 KB (384 words) - 20:55, 18 September 2023
  • ...Arrhenius-Weibull model to the observed data and analyze the result of the test. The following times-to-failure data were observed. :* The stress values used in the test were well within the "specification limits" for the product (see discussion
    2 KB (248 words) - 02:56, 16 August 2012
  • ...idual trial by trial. The table below shows the data set obtained from the test. The first column specifies the number of failures that occurred in each in ...aneous reliability and the 2-sided 90% confidence bounds at the end of the test?
    2 KB (321 words) - 21:21, 18 September 2023
  • ...dates the results for an exponential chi-squared reliability demonstration test design in Weibull++. ...s tested for a total of 2,000 hours, and three failures were observed. The test was time-truncated. Assuming a constant failure rate, what is the demonstra
    1 KB (144 words) - 16:25, 28 September 2015
  • ...e are two design options for a new product. The engineers need to design a test that compares the reliability performance of these two options. The reliabi ...nitial setup, set the sample size for each design to '''20''', and use two test durations of '''3,000''' and '''5,000''' hours. The following picture shows
    4 KB (610 words) - 18:56, 18 September 2023
  • *The test will be conducted in seven phases. The cumulative phase end times are <math ...plan is to test 1,000 hours per week, so the average fix delay in terms of test hours for phases 1 and 2 is <math>{{L}_{1}}=1000\,\!</math> and <math>{{L}_
    4 KB (744 words) - 20:54, 18 September 2023
  • ...xes, BD modes (test-find-test), are allowed. BC modes and fixes during the test cannot be entered. In this scenario, you want a stable system such that the
    2 KB (252 words) - 18:31, 24 April 2014
  • A 15-stage reliability development test program was performed. The grouped per configuration data set is shown in t #What is the maximum reliability attained as the number of test stages approaches infinity?
    2 KB (223 words) - 21:22, 18 September 2023
  • ...the test. The following table presents the data collected over the entire test. Find the Crow-AMSAA parameters and the intensity function using maximum li <center>'''Developmental Test Data''' </center>
    2 KB (242 words) - 21:21, 18 September 2023
  • This example validates the results for the 3 level optimum test plan with two stresses in ALTA. ...e stress in volts/mm. The planning values for the model parameters for the test plan are:
    6 KB (859 words) - 18:24, 28 September 2015
  • You can use the non-parametric Bayesian method to design a test for a system using information from tests on its subsystems. For example, s ...s prior distribution, we now can design a system reliability demonstration test by calculating system reliability ''R'', confidence level ''CL'', number of
    3 KB (403 words) - 18:55, 18 September 2023
  • ...t, it was recorded as a failure. Note that, at this development stage, the test did not consider whether or not the target was destroyed.
    2 KB (283 words) - 21:23, 18 September 2023
  • ...imes-to-failure for the upcoming test. The purpose is to explore different test durations in order to demonstrate an MTBF of 200 hours. ...urrent" data sheet and then set the number of systems to 3. Initially, the test is set to be time terminated with 2,000 operating hours per system, for a t
    4 KB (575 words) - 20:54, 18 September 2023
  • ...escription of the assumptions of the test plan, if the action is part of a test plan. '''String'''. ...he description of the results of the test plan, if the action is part of a test plan. '''String'''.
    10 KB (1,473 words) - 20:13, 29 April 2016
  • ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
    2 KB (265 words) - 18:23, 3 April 2017
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Find-Test Data}} This example validates the results for test-find-test data in RGA.
    3 KB (392 words) - 18:26, 28 September 2015
  • ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
    1 KB (146 words) - 18:08, 3 April 2017
  • ...> and <math>{{T}_{4}}=100000\,\!</math>. The average fix delay in terms of test hours for each phase is: <math>{{L}_{1}}=10000\,\!</math>, <math>{{L}_{2}}= ...gram was initiated and actual test data from phase 1 is now available. The test data were analyzed using the Crow Extended - Continuous Evaluation model an
    4 KB (712 words) - 20:53, 18 September 2023
  • {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Find-Test Data}} This example validates the results for test-fix-find-test data in RGA.
    2 KB (268 words) - 18:27, 28 September 2015
  • Consider the following test data, as shown in the following Table B.1.
    369 bytes (56 words) - 23:49, 27 June 2011
  • ...include>shown in the [[Test-Find-Test_Data_Example|Crow Extended Test-Find-Test Data example]]</noinclude><includeonly>given above</includeonly>.
    4 KB (487 words) - 21:29, 18 September 2023
  • ...that the two accelerated bend stresses are 90º and 180º. For the 90º bend, test the paper clip using the following procedure. Use a similar procedure for t '''Paper Clip Test'''
    3 KB (539 words) - 07:40, 7 August 2012
  • #What is the rate at which unique BD modes are being generated during this test? #If the test continues for an additional 50 hours, what is the minimum number of new uni
    5 KB (727 words) - 21:23, 18 September 2023
  • ==Common Beta Hypothesis Test== ...rences|[17]]], suppose that <math>K\,\!</math> number of systems are under test. Each system has an intensity function given by:
    8 KB (1,083 words) - 20:40, 18 September 2023
  • ...a test, we must determine the sample size to test as well as the expected test duration. The next simple example illustrates the methods available in Simu ...ed until we arrive at an acceptable test design (i.e., number of units and test duration).
    6 KB (953 words) - 19:16, 15 September 2023
  • ...cenarios where a major change occurs during a reliability growth test. The test data can be broken into two segments with a separate Crow-AMSAA (NHPP) mode Consider the data in the following plot from a reliability growth test.
    5 KB (750 words) - 20:37, 18 September 2023
  • ...test consisted of 15 runs. The following table presents the data from the test. Find the Logistic model that best fits the data set, and plot it along wit ...that the test starts when the reliability is not equal to zero or one. The test essentially begins at time 1, and is now considered as time 0 with <math>N=
    3 KB (388 words) - 21:23, 18 September 2023
  • ...es obtained from a reliability growth test of a newly designed system. The test has a duration of 660 hours. <center>Failure Times From a Reliability Growth Test</center>
    6 KB (839 words) - 20:37, 18 September 2023
  • ...g the second month, two prototypes were tested for a total of 250 hours of test time. The next table shows the successive <math>N=86\,\!</math> failure tim <li>For the time terminated test:
    5 KB (640 words) - 20:38, 18 September 2023
  • ...ze in the test using SimuMatic. The accelerated test will be a temperature test at 350K, 375K and 400K with a use temperature of 300K. The Arrhenius model The next step is to determine the stress levels and the allocated test units at each level. The engineer chooses to start the analysis with a samp
    4 KB (680 words) - 07:39, 8 August 2012
  • |+'''Success/Failure Data for a Variable Number of Tests Performed in Each Test Stage''' !Test Stage Number(<math>k\,\!</math>)
    5 KB (567 words) - 21:29, 18 September 2023
  • ...MyControl {{APIPrefix|As New}} cXfmeaControl({{APIString|"Lamp durability test #456"}})
    604 bytes (59 words) - 15:14, 3 August 2017
  • ...led action record. Enables the use of additional properties for describing test plans.
    431 bytes (53 words) - 21:33, 13 November 2015
  • |+'''Developmental Test Data''' !Test Time Unit 1(hours)
    3 KB (354 words) - 21:21, 18 September 2023
  • <li>Experiment with the impact of sample size, test time and growth parameters on analysis results. ...where the termination time needs to be specified, or a failure terminated test, where the number of failures needs to be specified. The generated failure
    10 KB (1,542 words) - 20:20, 2 June 2014
  • ...the cumulative number of trials in each interval for a reliability growth test. For example, the first row indicates that for an interval of 14 trials, 5 ...imates, we can calculate the instantaneous unreliability at the end of the test, or <math>T=68.\,\!</math>
    2 KB (225 words) - 21:22, 18 September 2023
  • ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
    6 KB (800 words) - 18:15, 3 April 2017
  • ...system underwent reliability growth testing for a total of 20 trials. The test was performed as a combination of groups of units with the same configurati #Calculate the demonstrated reliability at the end of the test.
    4 KB (571 words) - 20:53, 18 September 2023
  • ...f failures that can occur during the demonstration test and still pass the test. Used in the design of reliability tests for repairable systems. *'''Average Fix Delay:''' The average test time required to incorporate corrective actions into the configuration. A f
    14 KB (2,147 words) - 20:41, 18 September 2023
  • ...mation. The analysis retains the contribution of the interval to the total test time, but no assumptions are made regarding the actual number of failures o
    4 KB (533 words) - 21:15, 18 September 2023
  • <noinclude>{{Template:ALTABOOK|Additional Tools|Accelerated Life Test Plans}}</noinclude> ...of the different stress types' levels). This section presents some common test plans for one-stress and two-stress accelerated tests.
    16 KB (2,516 words) - 19:20, 15 September 2023
  • ...clude>in the [[Test-Fix-Find-Test_Data_Example|Crow Extended Test-Fix-Find-Test Example]]</noinclude><includeonly>given above</includeonly>.
    5 KB (711 words) - 21:31, 18 September 2023
  • ...3 in another). In the second column enter F if the patients completed the test and S if they didn't. In the third column enter the time, and in the fourth
    3 KB (392 words) - 21:45, 18 September 2023
  • During a reliability growth test, once a failure has been analyzed and corrective actions for that specific For example, after one successful test following a corrective action, <math>{{S}_{n}}=1\,\!</math>, the failure is
    2 KB (318 words) - 20:39, 18 September 2023
  • After a 20-stage reliability development test program, 20 groups of success/failure data were obtained and are given in t |+'''The Test Results and Reliabilities of Each Stage Calculated from Raw Data and the Pr
    4 KB (477 words) - 21:30, 18 September 2023
  • ...ons were applied during the test while others were delayed until after the test was completed. The tables below give the data set and the effectiveness fac
    3 KB (373 words) - 20:52, 18 September 2023
  • ...of 328K and 2V, respectively. The following table shows the data from the test:
    2 KB (279 words) - 02:48, 16 August 2012
  • ...has elapsed. Step-stress testing can substantially shorten the reliability test's duration. In addition to step-stress testing, there are many other types ...following steps, in hours, were used to apply stress to the products under test: 0 to 250, 2V; 250 to 350, 3V; 350 to 370, 4V; 370 to 380, 5V; 380 to 390,
    9 KB (1,418 words) - 22:02, 20 April 2023
  • ...tem underwent reliability growth development for a total of 20 trials. The test was performed as a combination of configuration in groups and individual tr ...modes. There are 5 BD modes. Of these 5 modes, 2 are corrected during the test (BD3 and BD4) and 3 have not been corrected by time <math>T=20\,\!</math> (
    7 KB (930 words) - 20:53, 18 September 2023
  • ...s (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and es
    862 bytes (125 words) - 19:03, 18 September 2023
  • ...ath>, <math>{{L}_{2}}=700\,\!</math> and <math>{{L}_{3}}=1000\,\!</math> test hours, respectively. <li>The MTBF that can be reached at the end of the last test phase based on the nominal idealized growth curve.</li>
    11 KB (1,658 words) - 20:53, 18 September 2023
  • ===Sequential Data from Missile Launch Test===
    3 KB (460 words) - 18:18, 29 May 2014
  • ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
    8 KB (938 words) - 18:22, 3 April 2017
  • *Likelihood Ratio Test, Tests of Comparison and Degradation Analysis *Accelerated Life Test Plans</li>
    3 KB (321 words) - 18:16, 15 September 2023
  • This example validates the results for a non-parametric binomial test design in Weibull++.
    791 bytes (107 words) - 16:24, 28 September 2015
  • {{template:LDABOOK|22|Reliability Test Design}} ...rate if the product reliability can meet the requirement. For this type of test design, four methods are supported in Weibull++:
    22 KB (3,517 words) - 21:22, 10 December 2015
  • ...ular value called the goal or requirement. Therefore, determining how much test time is needed for a particular system is generally of particular interest ...) model and the Duane postulate are accepted as the pattern for a test-fix-test reliability growth testing program, then the form of the Crow-AMSAA (NHPP)
    10 KB (1,604 words) - 21:24, 31 January 2017
  • ...r variables only take a value of 1 or 0. For example, consider a sample of test units. A number of these units were obtained from Lot 1, others from Lot 2, Assume that an accelerated test was performed with these units, and temperature was the accelerated stress.
    2 KB (369 words) - 23:58, 23 June 2015
  • ...sile component of a landing gear is put through an accelerated reliability test to determine whether the life goal would be achieved under the designed-in The following table shows the data from the test.
    3 KB (469 words) - 04:00, 15 August 2012
  • ...10% of the population. The following table shows the times-to-failure and test temperatures. 1) Since the failure occurred at the very beginning of the test and for an unrelated reason, it can be omitted from the analysis. If it is
    6 KB (935 words) - 08:04, 15 August 2012
  • ...escription of the assumptions of the test plan, if the action is part of a test plan. '''String'''. ...he description of the results of the test plan, if the action is part of a test plan. '''String'''.
    20 KB (2,421 words) - 22:51, 10 August 2018
  • ...<math>{{N}_{j}}\,\!</math>, and the total number of BD failures during the test is <math>{{N}_{BD}}=\underset{j=1}{\overset{M}{\mathop{\sum }}}\,{{N}_{j}}\ |colspan="7" style="text-align:center"|'''Test-Find-Test Data'''
    6 KB (731 words) - 21:30, 18 September 2023
  • ...t will be addressed by corrective actions if a failure mode is seen during test. When a failure mode in the Type B part of the system is seen during test, a corrective action will be implemented. For discrete trials, the correcti
    17 KB (2,630 words) - 16:46, 14 April 2017
  • ...ter the completion of the test or some fixes may be implemented during the test while others are delayed and some are not fixed at all. The Crow extended m ...ntil the end of testing, which can be a single or, most commonly, multiple test phases, the idealized curve increases steadily according to a learning curv
    18 KB (2,977 words) - 21:42, 31 January 2017
  • where ''TTT'' is the total test time and <math>x^{2}_{(1-\alpha; 2)}\,\!</math> is the <math>1 - \alpha \,\
    993 bytes (135 words) - 16:17, 28 September 2015
  • #Estimate the instantaneous MTBF of the system at the end of the test (demonstrated MTBF). The BD modes are implemented at the end of the test and assume a fixed effectiveness factor equal to 0.6 (i.e., 40% of the fail
    3 KB (367 words) - 21:35, 18 September 2023
  • ...n shape parameter test result: the likelihood ratio common shape parameter test statistic is 4.7. It is larger than the critical value 3.84. This indicates * The likelihood ratio common shape parameter test statistic is 4.7, as shown next.
    4 KB (563 words) - 18:18, 28 September 2015
  • ==Common Shape Parameter Likelihood Ratio Test== ...be utilized, as described in Nelson [[Appendix_E:_References|[28]]]. This test applies to any distribution with a shape parameter. In the case of ALTA, it
    11 KB (1,763 words) - 00:33, 16 March 2023
  • ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
    6 KB (819 words) - 15:12, 3 August 2017
  • 24 units were reliability tested, and the following life test data were obtained:
    1 KB (126 words) - 21:38, 18 September 2023
  • ...roposed management strategy is to delay corrective actions until after the test. The tables shown next display the data set and the associated effectivenes
    4 KB (553 words) - 20:53, 18 September 2023
  • ...wth data. It involves recording the times-to-failure for the unit(s) under test. Time-to-failure data can be applied to a single unit or system or to multi ...test time) or non-cumulative format (where each row shows the incremental test time), as shown next.
    17 KB (2,723 words) - 21:58, 2 June 2014
  • ...system 2 ends at time = 541. All the BD modes are fixed at the end of the test. A fixed effectiveness factor equal to 0.6 is used. Answer the following qu
    1 KB (173 words) - 20:54, 18 September 2023
  • 12 electronic devices were put into a continuous accelerated life test and the following data were collected.
    1 KB (163 words) - 19:03, 18 September 2023
  • You can use the non-parametric Bayesian method to design a test using prior knowledge about a system's reliability. For example, suppose yo ...system reliability to solve the required sample size in the demonstration test.
    3 KB (493 words) - 18:55, 18 September 2023
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